A hyperspectral scanning microscope system for phenomenology support
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説明
Three hyperspectral imaging systems have been implemented as microscopic hyperspectral imagers to support phenomenology studies at high spatial resolution. Wavelength ranges are VNIR (500 to 1000 nm), SWIR (1000 nm to 2500 nm) and LWIR (7 to 14 microns). The spatial resolution of the system at all wavelengths is 30 microns and covers a field of view of 8x30 mm. Samples are illuminated by rings of halogen lights and IR emitters for reflectance measurements and at thermal wavelengths can also be measured in thermal emission. Data are calibrated by scans of gold or Spectralon reflectance standards, and a flat plate blackbody for thermal emission measurements.
収録刊行物
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- SPIE Proceedings
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SPIE Proceedings 10210 102100K-, 2017-05-03
SPIE