Construction of an Optical Sum Frequency Microscope with Confocal Optics
Description
We have demonstrated confocal sum frequency (SF) microscopy. The SF intensity images were obtained when the incident beams were focused at different depths in the ZnS sample from 0 ?m to 10 ?m.
Journal
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- Advances in Optical Sciences Congress
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Advances in Optical Sciences Congress JWA23-, 2009-01-01
OSA