DC short-circuit treeing phenomenon in EPR at cryogenic temperature
説明
In this paper, we have studied the dc short-circuit treeing resistivity of EPR at both liquid nitrogen temperature and room temperature to elucidate the space charge behavior in this insulator at cryogenic temperature and discussed the space charge injection in EPR.
収録刊行物
-
- Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics
-
Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics 621-625, 2002-11-19
IEEE