Non-universal Roll-off Of MOSFET Mobility And V/sub DS/ Effect In Mobility Measurement

収録刊行物

• [Proceedings] 1993 International Workshop on VLSI Process and Device Modeling (1993 VPAD)

  [Proceedings] 1993 International Workshop on VLSI Process and Device Modeling (1993 VPAD) 176-177, 2005-08-24

  IEEE