<title>Elliptically polarized white-light photoviscoelastic technique and its application</title>

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The present paper demonstrates the successful application of the photo viscoelastic technique using elliptically polarized white light to the stress field evaluation of the crack growth in a viscoelastic strip. Using the proposed technique, which can determine both iso chromatic and iso clinic parameters simultaneously from a single color image, the time-dependent stress intensity factor extended for linearly viscoelastic materials is evaluated from the experimental results using a method based on least-squares. The result show that the value of the prosed critical stress intensity factor for fast crack growth may be considered as a characteristic property of the material under monotonically increasing load.© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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