X-ray Photoelectron and UV Photoyield Spectroscopic Studies on Structural and Electronic Properties of Sr<sub>x</sub>Bi<sub>y</sub>Ta<sub>2</sub>O<sub>9</sub> Films

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<jats:title>ABSTRACT</jats:title><jats:p>Photoelectron spectra by X-ray photoelectron spectroscopy (XPS) and UV-photoyield spectroscopy (UV-PYS) have been analyzed to study O<jats:sub>2</jats:sub>-annealing effects on band diagrams of ferroelectric Sr<jats:sub>x</jats:sub>Bi<jats:sub>y</jats:sub>Ta <jats:sub>2</jats:sub>O<jats:sub>9</jats:sub> (SBT) thin films deposited by pulsed laser deposition (PLD) and metalorganic dcecomposition (MOD) methods. XPS studies on the annealed PLD-SBT film has shown a rapid shift in its Bi 4f core peaks from the oxidized to the metallic ones, as the film suffer Ar<jats:sup>+</jats:sup> bombardment. Surface of the annealed film has exhibited lower Fermi level than the as-deposited one in UV-PYS. The result suggests O<jats:sub>2</jats:sub>-annealing can suppress leakage current through PLD-SBT films. The UV-PYS studies on MOD-SBT have shown almost the intrinsic Fermi levels before and after the additional annealing. The XPS studies have shown that the additional annealing is not effective to improve stabilities of (Bi<jats:sub>2</jats:sub>O<jats:sub>2</jats:sub>)<jats:sup>2+</jats:sup> layers, once the film is baked and crystallized.</jats:p>

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  • MRS Proceedings

    MRS Proceedings 748 2002-01-01

    Springer Science and Business Media LLC

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