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<title>395-nm and 790-nm femtosecond laser ablation of aluminum-doped zinc oxide</title>
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Description
We used 395-nm and 790-nm femtosecond laser pulses to deposit aluminum-doped zinc oxide films by pulsed laser deposition. Electrical resistivity of the films was lowered (5.6 x 104(Omega) cm) at 200 degree(s)C for the 395-nm laser pulses, while maintaining the optical transparency. In addition, the deposition rate increased six times. Optical emission was measured to compare the plumes generated by 395-nm and 790-nm laser pulses. We found that the emission from ions was suppressed relative to neutral atoms. Also the kinetic energy of ejected species was nearly doubled for the 395-nm laser pulses.© (2000) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Journal
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- SPIE Proceedings
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SPIE Proceedings 4088 25-28, 2000-11-06
SPIE
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Details 詳細情報について
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- CRID
- 1873116917677266560
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- ISSN
- 0277786X
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- Data Source
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- OpenAIRE