Erratum to “Degradation Analysis of 2 $\mu$m DFB Laser Using Optical Beam Induced Current Technique” [Oct 07 2644-2649]
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説明
In the above titled paper (ibid., vol. 54, no. 20, pp. 2644-2649, Oct. 07), there were errors for which corrections are presented here.
収録刊行物
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- IEEE Transactions on Electron Devices
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IEEE Transactions on Electron Devices 55 701-701, 2008-02-01
Institute of Electrical and Electronics Engineers (IEEE)
