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Erratum to “Degradation Analysis of 2 $\mu$m DFB Laser Using Optical Beam Induced Current Technique” [Oct 07 2644-2649]
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Description
In the above titled paper (ibid., vol. 54, no. 20, pp. 2644-2649, Oct. 07), there were errors for which corrections are presented here.
Journal
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- IEEE Transactions on Electron Devices
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IEEE Transactions on Electron Devices 55 701-701, 2008-02-01
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1873398392518428032
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- ISSN
- 00189383
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- Data Source
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- OpenAIRE