Erratum to “Degradation Analysis of 2 $\mu$m DFB Laser Using Optical Beam Induced Current Technique” [Oct 07 2644-2649]

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Description

In the above titled paper (ibid., vol. 54, no. 20, pp. 2644-2649, Oct. 07), there were errors for which corrections are presented here.

Journal

IEEE Transactions on Electron Devices

IEEE Transactions on Electron Devices 55 701-701, 2008-02-01

Institute of Electrical and Electronics Engineers (IEEE)

Details 詳細情報について

CRID

1873398392518428032
DOI

10.1109/ted.2007.912944
ISSN

00189383
Data Source
- OpenAIRE

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