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Reconstruction Of Surfaces Of 3-D Objects By M-array Pattern Projection Method
Description
A common problem of Pattern projection methods to measure surfaces of 3-D objects is that an observed pattern possibly i ncludes disorders such as deficiency, d isplacement, and permutation of subpatterns. These disorders make it difficult to match observed patterns with its position on the projected one and cause wrong m easurements as a result. This paper proposes a new technique to correct pattern disorders by using a pattern made from an M-array which is a two-dimensional extension of a well-known M-sequence.
Journal
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- [1988 Proceedings] Second International Conference on Computer Vision
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[1988 Proceedings] Second International Conference on Computer Vision 468-473, 2005-08-24
IEEE