A Structural Analysis Method for Graphite Intercalation Compounds

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<jats:title>ABSTRACT</jats:title><jats:p>Study of the microstructure of electronic materials can be enhanced by using high resolution transmission electron microscopy (TEM) combined with the technique of digitized image analysis. We show here a practical image analysis method for the microstructures of acceptor graphite intercalation compounds (GICs) with CuCl<jats:sub>2</jats:sub> and FeCl<jats:sub>3</jats:sub> intercalates. The two dimensional fast Fourier transform (2D-FFT) was used for the frequency analysis of the TEM pictures. It is found that the lattice images of CuCl<jats:sub>2</jats:sub>-GICs consist of different frequency images corresponding to specific frequencies. The detailed features of the stage-1 structure of the FeCl<jats:sub>3</jats:sub>-GICs is extracted quantitatively by this method from a relatively indistinct TEM picture. The stage structure of the CuCl<jats:sub>2</jats:sub>- and FeCl<jats:sub>3</jats:sub>-GICs are further investigated by analyzing the reconstruction of the TEM images by means of the two dimensional inverse FFT (2D-IFFT).</jats:p>

Journal

  • MRS Proceedings

    MRS Proceedings 658 2000-01-01

    Springer Science and Business Media LLC

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