Evaluation of properties of various type CdTe hard x-ray detectors
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説明
M-π -n detector and Schottky detector which were different barriers were evaluated by measuring spectrum as imaging detectors. These spectrum performances showed that the effect of polarization in these detectors was similarly occurred. The current-time characteristics and capacitance-time characteristics were measured for the detectors and it was found that these characteristics were due to the effect of polarization.
収録刊行物
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- SPIE Proceedings
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SPIE Proceedings 5922 592210-, 2005-08-18
SPIE