<title>Determination of the normalized Jones matrix of elliptical retarder</title>
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説明
Although photoelasticity technique has recently become sufficiently refined due to use of digital image processing, the difficulties with an appropriate accuracy, especially in integrated (three-dimensional) photoelasticity still persist. Specifically, there remains a problem with a precise imaging of three optical parameters describing a general three-dimensional model in the regions, where mutual interference of these parameters leads to deteriorated accuracy. In this paper it is shown how to improve imaging accuracy of PSA Fourier polarimetry method, recently suggested for use in integrated photoelasticity (Berezhna S.Yu., et al, Integrated photoelasticity through imaging Fourier polarimetry of an elliptic retarder, Applied Optics, IP, 2001, No 1). This can be overcome by incorporation of a compensator into the polarimeter arrangement. Use of the compensator provides equally precise imaging of birefringence through the whole possible range of phase and ellipticity angle values. Also it allows for determining a sign of phase.
収録刊行物
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- SPIE Proceedings
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SPIE Proceedings 4317 129-134, 2001-06-13
SPIE