Optical critical-point structures of Si: Symmetry analysis by low-field electroreflectance
説明
The critical-point locations in the Brillouin zone and the relations among the interband reduced masses at these points are determined for theE’0,E1 andE2 optical structures in Si. As a synthesis, theE4–5(k) energy contours are constructed from the experimental results.
収録刊行物
-
- Il Nuovo Cimento B Series 11
-
Il Nuovo Cimento B Series 11 39 387-391, 1977-06-01
Springer Science and Business Media LLC