Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm
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説明
Temporal carrier has been introduced to electronic speckle interferometry (ESPI) in order to produce virtual speckle patterns. Dynamic deformation measurement with a large deformation is performed by using virtual speckle patterns. However, it takes a long calculating time to produce virtual speckle patterns, because the method requires Fourier transform operation at each pixel of CCD. In the proposed method, virtual speckle patterns are produced by algorithm without Fourier transform. As the results, it is confirmed that the calculating cost of virtual speckle patterns is improved remarkably, and that the new method also is equal to the ordinary methods in measurement accuracy.
収録刊行物
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- SPIE Proceedings
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SPIE Proceedings 7389 73890I-, 2009-06-15
SPIE