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A defect-tolerant design for mask ROMs
Description
A new defect-tolerant design technique for mask ROMs is proposed. In the proposed technique a Reed-Solomon code with distance three is utilized. A built-in circuit can repair a defect or defects within a word. The overhead area of the defect-tolerant circuits is estimated to be about 1% for a 4 M-bit mask ROM with eight outputs. >
Journal
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- Digest of Papers. 1992 IEEE VLSI Test Symposium
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Digest of Papers. 1992 IEEE VLSI Test Symposium 171-175, 2003-01-02
IEEE
