Electron beam tester aided fault diagnosis for logic circuits based on sensitized paths
説明
In this paper, we propose an electron beam tester (EB-tester) aided fault diagnosis for combinational and sequential circuits based on sensitized paths. For combinational circuits, we enhance the previous set of sensitizing input pairs and present EB-tester aided fault diagnosis. For sequential circuits, we introduce a measure for selecting internal lines to be probed and present EB-tester aided fault diagnosis. Experimental results of ISCAS'85 and ISCAS'89 benchmark circuits show the efficiency of the presented methods.
収録刊行物
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- Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259)
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Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) 237-241, 2002-11-27
IEEE Comput. Soc
