IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER FOR PIXE

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<jats:p> A narrow entrance slit was attached to an in-air high-resolution PIXE system composed of a flat analyzing crystal and a position-sensitive proportional counter. Chemical shift measurements were carried out for Si, P and S Kα<jats:sub>1,2</jats:sub> lines from various sample targets. The precision of measurements is much improved compared with that obtained by the position-sensitive crystal spectrometer system without the entrance slit. The new system equipped with the entrance slit does not require exact sample positioning. It is applicable to non-flat targets. Chemical shift measurements are also possible while moving the targets. </jats:p>

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