Quantitative HRTEM study of zeolite

この論文をさがす

説明

Abstract We demonstrate the application of a new technique of high-resolution transmission electron microscopy (HRTEM) study, which is assisted by a quantitative measurement of electron diffraction intensities using a slow-scan CCD camera, to the structure analysis of zeolite frameworks as well as materials incorporated in their micropores. A Fourier analysis of electron diffraction intensities, combined with crystallographic phase information derived from an observed HRTEM image, indicated individual projected T-atom positions of the MFI zeolite framework, with a resolution higher than the original HRTEM image. A Fourier map obtained from electron diffraction intensities of a Na-FAU zeolite containing MoS2 clusters clearly revealed additional potential distributions inside the supercages, compared with the original Na-FAU without MoS2. The kinematical diffraction approximation can be reasonably applied for the analysis, resulting in framework atom positions of these zeolites and location of incorporated materials with a resolution of fine details around 1 A.

収録刊行物

詳細情報 詳細情報について

問題の指摘

ページトップへ