Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy

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Using a three-dimensional image intensity distribution obtained by spherical aberration-corrected transmission electron microscopy, we studied a cross-sectional image (x-z image) of a gold crystal observed along the z-axis. In this x-z image, the bending of the interference fringes was observed in the edge region. We demonstrated that the bending is caused by a relative phase shift between the electron waves induced by dynamical electron scattering. By comparing with simulated images, the relative phase shift of about π/4 was proved to correspond to a difference in thickness of ∼0.9 nm.

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