Study of Oxygen Atom Clustering in Si Induced by External Stress by Means of a Monoenergetic Positron Beam

詳細情報 詳細情報について

• CRID

  1874242817980457216

• DOI

  10.4028/www.scientific.net/msf.105-110.1467

• ISSN

  16629752

• データソース種別

  • OpenAIRE