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Study of Oxygen Atom Clustering in Si Induced by External Stress by Means of a Monoenergetic Positron Beam
Journal
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- Materials Science Forum
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Materials Science Forum 105-110 1467-1470, 1992-01-01
Trans Tech Publications, Ltd.
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Details 詳細情報について
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- CRID
- 1874242817980457216
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- ISSN
- 16629752
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- Data Source
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- OpenAIRE
