A New Framework for Critical Area Estimation in VLSI

Bibliographic Information

Title
A New Framework for Critical Area Estimation in VLSI
Author
X.Jiang, Y.Hao, S.Horiguchi

Journal

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Details 詳細情報について

  • CRID
    1010000781782554637
  • Article Type
    journal article
  • Data Source
    • KAKEN

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