Evaluation of Damage in DNA Molecules Resulting from Very-Low-Frequency Magnetic Fields by Using Bacterial Mutation Repairing Genetic System
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- KOBAYASHI Koichiro
- Iwate University, Faculty of Enging., Associate Professor
Bibliographic Information
- Title
- Evaluation of Damage in DNA Molecules Resulting from Very-Low-Frequency Magnetic Fields by Using Bacterial Mutation Repairing Genetic System
- Author
- Akira IGARASHI, Koichiro KOBAYASHI, Hidetoshi MATSUKI, Ginro ENDO, Akira HAGA
Journal
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- IEEE Transactions on Magnetics(November,2005) Vol.41,No.11
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IEEE Transactions on Magnetics(November,2005) Vol.41,No.11 4368-4370, 2005
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Details 詳細情報について
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- CRID
- 1010000781805346441
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- Article Type
- journal article
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- Data Source
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- KAKEN