Chiba Scan Delay Fault Testing with Short Test Application Time
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- NAMBA Kazuteru
- Chiba University
Bibliographic Information
- Title
- Chiba Scan Delay Fault Testing with Short Test Application Time
- Author
- 難波一輝, 伊藤秀男
Journal
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- Journal of Electronic Testing : Theory and Applications
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Journal of Electronic Testing : Theory and Applications 26 667-677, 2010
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Details
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- CRID
- 1010000782091696260
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- Article Type
- journal article
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- Data Source
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- KAKEN
