Delay fault ATPG for F-scannable RTL circuits
書誌事項
- タイトル
- Delay fault ATPG for F-scannable RTL circuits
- 著者
- Marie Engelene Jimenez Obien, Satoshi Ohtake, Hideo Fujiwara
収録刊行物
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- Proceedings of IEEE International Symposium on Communications and Information Technologies
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Proceedings of IEEE International Symposium on Communications and Information Technologies 2010