Delay fault ATPG for F-scannable RTL circuits
Bibliographic Information
- Title
- Delay fault ATPG for F-scannable RTL circuits
- Author
- Marie Engelene Jimenez Obien, Satoshi Ohtake, Hideo Fujiwara
Journal
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- Proceedings of IEEE International Symposium on Communications and Information Technologies
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Proceedings of IEEE International Symposium on Communications and Information Technologies 2010
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Details 詳細情報について
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- CRID
- 1010000782131345175
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- Article Type
- journal article
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- Data Source
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- KAKEN