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極薄SOI膜のゼーベック係数制御とナノ構造熱電特性測定技術の構築

Bibliographic Information

Title
極薄SOI膜のゼーベック係数制御とナノ構造熱電特性測定技術の構築
Author
池田浩也,鈴木悠平,三輪一聡,ファイズ・サレ

Journal

  • 信学技報

    信学技報 ED2013-137, SDM2013-152 31-35, 2014

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Details

  • CRID
    1010000782219417613
  • Article Type
    journal article
  • Data Source
    • KAKEN

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