Hot Carrier Degradation of SiGe/Si Heterointerface and Experimental Estimation of Density of Locally Generated Heterointerface Traps
Bibliographic Information
- Title
- Hot Carrier Degradation of SiGe/Si Heterointerface and Experimental Estimation of Density of Locally Generated Heterointerface Traps
- Author
- T.Tsuchiya、S.Mishima、M.Sakuraba, J.Murota
Journal
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- Jpn.J.Appl.Phys. Vol.46、No.8A
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Jpn.J.Appl.Phys. Vol.46、No.8A 5015-5020, 2007
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Details 詳細情報について
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- CRID
- 1010000782461448592
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- Article Type
- journal article
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- Data Source
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- KAKEN