A Test Generation Method for Path Delay Faults in Sequential Circuits with Discontinuous Reconvergence Structure
Bibliographic Information
- Title
- A Test Generation Method for Path Delay Faults in Sequential Circuits with Discontinuous Reconvergence Structure
- Author
- Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
Journal
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- Trans, of IEICE (DI) (in Japanese) Vol.J86-D-I, No.12
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Trans, of IEICE (DI) (in Japanese) Vol.J86-D-I, No.12 872-883, 2003
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Details 詳細情報について
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- CRID
- 1010282256779021456
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- Article Type
- journal article
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- Data Source
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- KAKEN