Quantitative Effects of Preferred Orientation and Impurity Phases on Ferroelectric Properties of SrBi_2(Ta_<1-x>Nb_x)2O_9 Thin Films by X-Ray Diffraction Reciprocal Space Mapping
書誌事項
- タイトル
- Quantitative Effects of Preferred Orientation and Impurity Phases on Ferroelectric Properties of SrBi_2(Ta_<1-x>Nb_x)2O_9 Thin Films by X-Ray Diffraction Reciprocal Space Mapping
- 著者
- K.Saito, I.Yamaji, T.Akai, M.Mitsuya, H.Funakubo
収録刊行物
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- Jpn.J.Appl.Phys. 42(2A)
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Jpn.J.Appl.Phys. 42(2A) 539-543, 2003