Quantitative Effects of Preferred Orientation and Impurity Phases on Ferroelectric Properties of SrBi_2(Ta_<1-x>Nb_x)2O_9 Thin Films by X-Ray Diffraction Reciprocal Space Mapping

Bibliographic Information

Title
Quantitative Effects of Preferred Orientation and Impurity Phases on Ferroelectric Properties of SrBi_2(Ta_<1-x>Nb_x)2O_9 Thin Films by X-Ray Diffraction Reciprocal Space Mapping
Author
K.Saito, I.Yamaji, T.Akai, M.Mitsuya, H.Funakubo

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Details

  • CRID
    1010282256782477570
  • Article Type
    journal article
  • Data Source
    • KAKEN

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