A Study of the Reliability of MOSFETs in Two Stacked Thin Chips for 3D System in Package
-
- 池田 晃裕
- 九州大学
書誌事項
- タイトル
- A Study of the Reliability of MOSFETs in Two Stacked Thin Chips for 3D System in Package
- 著者
- Akihiro Ikeda, et al.
収録刊行物
-
- Proc. IEEE 43rd International Reliability Physics Symposium
-
Proc. IEEE 43rd International Reliability Physics Symposium 578-579, 2005