Atomic-resolution STEM imaging of materials using a segmented annular all field detector
書誌事項
- タイトル
- Atomic-resolution STEM imaging of materials using a segmented annular all field detector
- 著者
- N.Shibata, S.D.Findlay, Y.Kohno, H.Sawada, Y.Kondo, Y.Ikuhara
収録刊行物
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- Microsc.Microanal.
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Microsc.Microanal. 16(Suppl 2) 124-125, 2010