Atomic-resolution STEM imaging of materials using a segmented annular all field detector

Bibliographic Information

Title
Atomic-resolution STEM imaging of materials using a segmented annular all field detector
Author
N.Shibata, S.D.Findlay, Y.Kohno, H.Sawada, Y.Kondo, Y.Ikuhara

Journal

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Details

  • CRID
    1010282257030770945
  • Article Type
    journal article
  • Data Source
    • KAKEN

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