Studies on Electrical and Retention Enhancement Properties of Metal-Ferroelectric-Insulator-Semiconductor with Radical Irradiation Treatments

Bibliographic Information

Title
Studies on Electrical and Retention Enhancement Properties of Metal-Ferroelectric-Insulator-Semiconductor with Radical Irradiation Treatments
Author
Le Van Hai, Takeshi Kanashima, Masanori Okuyama

Journal

  • INTECH

    INTECH (図書にも有) 2011

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Details 詳細情報について

  • CRID
    1010282257047745686
  • Article Type
    journal article
  • Data Source
    • KAKEN

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