Studies on Electrical and Retention Enhancement Properties of Metal-Ferroelectric-Insulator-Semiconductor with Radical Irradiation Treatments
書誌事項
- タイトル
- Studies on Electrical and Retention Enhancement Properties of Metal-Ferroelectric-Insulator-Semiconductor with Radical Irradiation Treatments
- 著者
- Le Van Hai, Takeshi Kanashima, Masanori Okuyama
収録刊行物
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- INTECH
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INTECH (図書にも有) 2011
