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An Analysis of Dynamism between Market Sensitivity to Technology and Optimal R&D Intensity
Bibliographic Information
- Title
- An Analysis of Dynamism between Market Sensitivity to Technology and Optimal R&D Intensity
- Author
- Y. Tou
Journal
-
- In International Association for Management of Technology (IAMOT) eds. (IAMOT 2007 Edited Book of Selected Paper. World Scientific Publishing, New York)
-
In International Association for Management of Technology (IAMOT) eds. (IAMOT 2007 Edited Book of Selected Paper. World Scientific Publishing, New York) 73-87, 2008
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Details 詳細情報について
-
- CRID
- 1010282257433741441
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
