An Analysis of Dynamism between Market Sensitivity to Technology and Optimal R&D Intensity
書誌事項
- タイトル
- An Analysis of Dynamism between Market Sensitivity to Technology and Optimal R&D Intensity
- 著者
- Y. Tou
収録刊行物
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- In International Association for Management of Technology (IAMOT) eds. (IAMOT 2007 Edited Book of Selected Paper. World Scientific Publishing, New York)
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In International Association for Management of Technology (IAMOT) eds. (IAMOT 2007 Edited Book of Selected Paper. World Scientific Publishing, New York) 73-87, 2008