Detecting Real Oxygen Ions in Polycrystalline Diamond Thin Film using Secondary Ion Mass Spectrometry
書誌事項
- タイトル
- Detecting Real Oxygen Ions in Polycrystalline Diamond Thin Film using Secondary Ion Mass Spectrometry
- 著者
- 中川翼、坂口勲、羽田肇、大橋直樹
収録刊行物
-
- Japanese Journal of Applied Physics Part 1, 46
-
Japanese Journal of Applied Physics Part 1, 46 3391-3393, 2007
