[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

Study on the Frequency Dependence of Lateral Energy Leakage in RF BAW Device by Fast-Scanning Laser Probe System

Bibliographic Information

Title
Study on the Frequency Dependence of Lateral Energy Leakage in RF BAW Device by Fast-Scanning Laser Probe System
Author
N.Wu, K.Hashimoto, K.Kashiwa, T.Omori, M.Yamaguchi

Journal

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Details

  • CRID
    1010282257442641815
  • Article Type
    journal article
  • Data Source
    • KAKEN

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