Study on the Frequency Dependence of Lateral Energy Leakage in RF BAW Device by Fast-Scanning Laser Probe System
Bibliographic Information
- Title
- Study on the Frequency Dependence of Lateral Energy Leakage in RF BAW Device by Fast-Scanning Laser Probe System
- Author
- N.Wu, K.Hashimoto, K.Kashiwa, T.Omori, M.Yamaguchi
Journal
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- Japanese Journal of Applied Physics 48
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Japanese Journal of Applied Physics 48 2009
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Details 詳細情報について
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- CRID
- 1010282257442641815
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- Article Type
- journal article
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- Data Source
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- KAKEN