Deep-ultraviolet micro-Raman investigation of surface defects in a 4H-SiC homoepitaxially grown film
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説明
<jats:p>The structures of comet defects in a 4H–SiC homoepitaxially grown film are investigated by deep-ultraviolet micro-Raman spectroscopy. Spatial distribution of the 4H- and 3C–SiC is clearly distinguished both from the intensities of the folded longitudinal acoustic phonon mode and the peak energies of the nonfolded longitudinal optical phonon mode. The mappings of these parameters indicate the existence of two types of comets. The mechanisms of heteropolytypic inclusion in comets are discussed.</jats:p>
収録刊行物
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- AA00543431
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AA00543431 87 (24), 241906-, 2005-12-12
American Institute of Physics
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詳細情報 詳細情報について
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- CRID
- 1050001201935174272
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- NII論文ID
- 120000904922
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- NII書誌ID
- AA00543431
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- ISSN
- 00036951
- 10773118
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- HANDLE
- 2433/24190
- 2433/7902
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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