光励起キャリア数を制御した圧電素子光熱変換分光法による半導体p-n接合界面の研究

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タイトル別名
  • A Study of the Recombination Process at the p-n Junction Interface by the Photoexcited-Carrier-Concentration Controlled Piezoelectric Photothermal Method
  • ヒカリ レイキ キャリアスウ オ セイギョ シタ アツデン ソシ コウネツ ヘンカン ブンコウホウ ニ ヨル ハンドウタイ p n セツゴウ カイメン ノ ケンキュウ

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抄録

It is important to control the carrier dynamics at p-n junction interface for high efficiency solar cells. In this study, the signal generation mechanisms of the Surface Photo-Voltage (SPV) and Piezoelectric Photo-Thermal (PPT) signals of Si p-n junction have investigated by using the photoexcited-carrier-concentration controlled incident light. Since the carrier accumulation (= SPV) and the recombination phenomenon (= PPT) are complementary, SPV and PPT should shows a peak and a dip, respectively. However, at hv = 1.30 eV, both SPV and PPT showed peaks. This was concluded that the PPT increased by a thermodynamic energy loss with phonon emitting within the conduction and valence bands.

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