X-Ray Diffraction Study of CeT<sub>2</sub>Al<sub>10</sub> (T = Ru, Os) at Low Temperatures and under Pressures
書誌事項
- タイトル別名
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- X-Ray Diffraction Study of CeT2Al10 (T = Ru, Os) at Low Temperatures and under Pressures
説明
We have carried out a powder X-ray diffraction investigation on antiferromagnetic Kondo semiconductorsCeRu2Al10 and CeOs2Al10 at low temperatures and under high pressures as well as the structural investigationon single crystal of these compounds. The results of powder X-ray studies of CeRu2Al10 and CeOs2Al10 indicatethat these compounds do not have structural transition at its antiferromagnetic ordering temperature. The resultsof single crystal structural refinement indicate that the b-axis of this crystal structure is insensitive not only topressure but also to temperature and that the effect of cooling to Ce–Ce distance for CeRu2Al10 is the same asthat for CeOs2Al10.
収録刊行物
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- Acta Physica Polonica A
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Acta Physica Polonica A 131 (4), 988-990, 2017
Institute of Physics of the Polish Academy of Sciences
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詳細情報 詳細情報について
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- CRID
- 1050282676656084992
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- NII論文ID
- 120006529889
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- ISSN
- 1898794X
- 05874246
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- HANDLE
- 10258/00009541
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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