Bibliographic Information
- Other Title
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- コウブンカイノウ ・ コウバン ジキリョク ケンビキョウ ノ カイハツ ト ソノ ジセイ ザイリョウ ・ ジキ デバイス エ ノ オウヨウ
- Development of high-resolution alternating magnetic force microscopy and its application to advanced magnetic materials and devices
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Abstract
We have developed novel magnetic force microscopy named as alternating magnetic force microscopy (A-MFM) for DC and AC magnetic fields imaging with ultra high spatial resolution of less than 5 nm. A-MFM utilizes frequency modulation of cantilever oscillation induced by applying off-resonant alternating magnetic force to high sensitive homemade magnetic tip. A-MFM is the first magnetic force microscopy which enables near-surface magnetic imaging. A-MFM has several new functionalities such as, a) zero detection of magnetic field, b) polarity detection of magnetic field, c) stroboscopic AC magnetic field imaging and d) vector DC magnetic fields imaging with selectable measuring axis.
Journal
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- Scientific and technical reports of Graduate school of Engineering and Resource Science, Akita University
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Scientific and technical reports of Graduate school of Engineering and Resource Science, Akita University 36 1-7, 2015-10-31
秋田大学大学院工学資源学研究科
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Details 詳細情報について
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- CRID
- 1050282677542553344
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- NII Article ID
- 120005678458
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- NII Book ID
- AA12500403
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- ISSN
- 21861382
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- HANDLE
- 10295/2989
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- NDL BIB ID
- 027036355
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- Text Lang
- ja
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- Article Type
- departmental bulletin paper
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- Data Source
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- IRDB
- NDL
- CiNii Articles