A New Method for Low-Capture-Power Test Generation for Scan Testing

IR IR (HANDLE) 2 Citations 26 References

Bibliographic Information

Published
2006-05-01
Resource Type
journal article
Rights Information
  • Copyright (c) 2006 The Institute of Electronics, Information and Communication Engineers
Publisher
電子情報通信学会

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Description

Research on low-power scan testing has been focused on the shift mode, with little consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR-drop, resulting in significant yield loss due to faulty test results. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified bits (X-bits) in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes can be obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.

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