Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995

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Bibliographic Information

Title
"Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995"
Statement of Responsibility
edited by Masashi Suezawa and Hiroshi Katayama-Yoshida
Publisher
  • Trans Tech Publications
Publication Year
  • c1995
Book size
25 cm
Series Name / No
  • : set
  • pt. 1
  • pt. 2
  • pt. 3
  • pt. 4
Other Title
  • Defects in semiconductors 18

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Details 詳細情報について

  • CRID
    1130000793786798720
  • NII Book ID
    BA27177886
  • ISBN
    0878497161
    0878497129
    0878497137
    0878497145
    0878497153
  • Text Lang
    en
  • Country Code
    sz
  • Title Language Code
    en
  • Place of Publication
    • Zürich, Switzerland
  • Classification
  • Data Source
    • CiNii Books
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