Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

Web Site CiNii Available at 11 libraries

Bibliographic Information

Title
"Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A."
Statement of Responsibility
editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho
Publisher
  • Materials Research Society
Publication Year
  • c1991
Book size
24 cm

Search this Book/Journal

Notes

Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics

Includes bibliogrpahical references and index

Related Books

See more

Details 詳細情報について

Back to top