Anomalous X-ray scattering for materials characterization : atomic-scale structure determination

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Bibliographic Information

Title
"Anomalous X-ray scattering for materials characterization : atomic-scale structure determination"
Statement of Responsibility
Yoshio Waseda
Publisher
  • Springer
Publication Year
  • c2002
Book size
24 cm

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Notes

"with 132 figures"

Includes bibliographical references and index

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Details 詳細情報について

  • CRID
    1130000793917264896
  • NII Book ID
    BA58657536
  • ISBN
    9783540434436
  • Text Lang
    en
  • Country Code
    gw
  • Title Language Code
    en
  • Place of Publication
    • Berlin
  • Data Source
    • CiNii Books
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