Lock-in thermography : basics and use for evaluating electronic devices and materials

Web Site CiNii Available at 1 libraries

Bibliographic Information

Title
"Lock-in thermography : basics and use for evaluating electronic devices and materials"
Statement of Responsibility
O. Breitenstein, W. Warta, M. Langenkamp
Publisher
  • Springer
  • 2nd ed
Publication Year
  • c2010
Book size
25 cm

Search this Book/Journal

Notes

Includes bibliographical references (p. 235-244) and index

Related Books

See more

Details 詳細情報について

Back to top