Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March, 1987, Bay Point, Florida
Bibliographic Information
- Title
- "Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March, 1987, Bay Point, Florida"
- Statement of Responsibility
- Ravi Jain, editor ; sponsored by SPIE--the International Societyfor Optical Engineering ; cooperating sponsor, the Metallurgical Society
- Publisher
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- SPIE
- Publication Year
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- c1987
- Book size
- 28 cm
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Notes
Includes bibliographies and index
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Details 詳細情報について
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- CRID
- 1130000794361870080
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- NII Book ID
- BA13194129
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- ISBN
- 0892528303
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- LCCN
- 87061008
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- Web Site
- https://lccn.loc.gov/87061008
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash., USA
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- Subject
-
- Data Source
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- CiNii Books
