Lock-in thermography : basics and use for evaluating electronic devices and materials

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Bibliographic Information

Title
"Lock-in thermography : basics and use for evaluating electronic devices and materials"
Statement of Responsibility
Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
Publisher
  • Springer Nature Switzerland
  • 3rd ed
Publication Year
  • c2018
Book size
25 cm

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Notes

Includes bibliographical references (p. 303-317) and index

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Details 詳細情報について

  • CRID
    1130000794407011456
  • NII Book ID
    BB27955071
  • ISBN
    9783319998244
  • LCCN
    2018952623
  • Web Site
    https://lccn.loc.gov/2018952623
  • Text Lang
    en
  • Country Code
    sz
  • Title Language Code
    en
  • Place of Publication
    • Cham
  • Data Source
    • CiNii Books
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